Simulation of Three-Layer Solid State Memcapacitor

dc.contributor.advisorBekele, Mulugeta (PhD)
dc.contributor.authorWami, Shiferaw
dc.date.accessioned2018-07-12T13:48:06Z
dc.date.accessioned2023-11-18T09:53:12Z
dc.date.available2018-07-12T13:48:06Z
dc.date.available2023-11-18T09:53:12Z
dc.date.issued2010-06
dc.description.abstractMemcapacitors are capacitors whose capacitance depends on the past states through which the system has evolved. The focus of this thesis is on the possible realization of a three-layer solid-state memory capacitive (memcapacitive) system. The functioning of this device is based on the slow polarization rate of a medium between plates of a regular capacitor. To achieve this goal, this work considers a three-layer structure embedded in a capacitor. The three layer structure is formed by metallic layers separated by an insulator so that non-linear electronic transport between the layers can occur. Unlike conventional capacitor, the capacitance of this device depends on the history of the system. Our calculation shows non-pinched hysteretic charge-voltage and capacitance-voltage curves, and both negative and diverging capacitance within certain ranges of the field. This property of memcapacitive system makes it a good candidate for non-volatile memory application.en_US
dc.identifier.urihttp://etd.aau.edu.et/handle/12345678/8387
dc.language.isoenen_US
dc.publisherAddis Ababa Universtyen_US
dc.subjectMemcapacitoren_US
dc.titleSimulation of Three-Layer Solid State Memcapacitoren_US
dc.typeThesisen_US

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