Scattering Distribution of Light from thin Film Rough Layers &Layer Stacks for A-Si:H Solar Cells.

dc.contributor.authorBerga, Tadesse
dc.date.accessioned2018-07-04T06:24:43Z
dc.date.accessioned2023-11-09T11:24:32Z
dc.date.available2018-07-04T06:24:43Z
dc.date.available2023-11-09T11:24:32Z
dc.date.issued1997-06
dc.description.abstractReflectance(R), Transmittance(T), and Scattering distribution of thin film TCOs and with their p-I (thin & thick) i-layer stacks have been measUred for various wavelengths. The shape of scattering distributions have been determined by using an easy plot software. The functional dependence of normalised intensity on - wavelength (A) and scattering angle (8) have been detennined for Asahi U & Standard TCO. The thickness of individual layers was determined from reflectance & transmittance measmements by using an optical simulation software for layer stacks. The diffused transmittance determined from transmittance measmement and scattering distribution measmements have been compareden_US
dc.identifier.urihttp://10.90.10.223:4000/handle/123456789/6104
dc.language.isoenen_US
dc.publisherAddis Ababa Universityen_US
dc.subjectScattering Distribution of Lighten_US
dc.titleScattering Distribution of Light from thin Film Rough Layers &Layer Stacks for A-Si:H Solar Cells.en_US
dc.typeThesisen_US

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