Optical Properties of Multilayer Stacks
| dc.contributor.advisor | Stutenbaeumer, Ulrich (PhD) | |
| dc.contributor.author | Beneberu, Solomon | |
| dc.date.accessioned | 2018-07-03T11:06:11Z | |
| dc.date.accessioned | 2023-11-09T11:24:11Z | |
| dc.date.available | 2018-07-03T11:06:11Z | |
| dc.date.available | 2023-11-09T11:24:11Z | |
| dc.date.issued | 1997-06 | |
| dc.description.abstract | The optical properties of a-Si:H multilayer stacks are determined by comparing the measured reflectance and transmittance spectra with a computer simulation using simple dielectric function models. The samples were produced in the research center Juelich (Germany), where also the reflectance spectra were obtained in the spectral region between 4,000 cm·1< wavenumber < 40,000 cm·1 • The transmittance spectra in the same spectral region for the same samples were done in the AAU spectroscopy laboratory. The obtained properties of the a-Si:H multilayer stacks, the layer thickness, the dielectric background and the band gap energy of the individual semiconductor materials are in good agreement with the reference values | en_US |
| dc.identifier.uri | http://10.90.10.223:4000/handle/123456789/5884 | |
| dc.language.iso | en | en_US |
| dc.publisher | Addis Ababa University | en_US |
| dc.subject | Multilayer Stacks | en_US |
| dc.title | Optical Properties of Multilayer Stacks | en_US |
| dc.type | Thesis | en_US |