Optical Properties of Multilayer Stacks
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Date
1997-06
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Addis Ababa University
Abstract
The optical properties of a-Si:H multilayer stacks are determined by comparing the
measured reflectance and transmittance spectra with a computer simulation using
simple dielectric function models. The samples were produced in the research center
Juelich (Germany), where also the reflectance spectra were obtained in the spectral
region between 4,000 cm·1< wavenumber < 40,000 cm·1
• The transmittance spectra in
the same spectral region for the same samples were done in the AAU spectroscopy
laboratory. The obtained properties of the a-Si:H multilayer stacks, the layer thickness,
the dielectric background and the band gap energy of the individual semiconductor
materials are in good agreement with the reference values
Description
Keywords
Multilayer Stacks