A Study on the Improvement of Surface Plasmon-Polariton (SPLP) Method for the Determination of Compelx Dielectric Permittivity € and Thickness of thin Metal Films.
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Date
1990-06
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Addis Ababa University
Abstract
The existing SPLP method for the determination of the
complex dielectric permittivity and the thickness of metal
film .1.s reviewed. A close electrodynamic analysis of
SPLP dispersion properties in very. thin metal films is
made. The analysis is based on the numerical solution of
the exact dispersion equation using the 'Downhill' method
and subsequent selection of physically reasonable results.
The selection is performed via the comparison of the power
flows through the boundaries of the metal film in the
transverse direction.
The explicit expressions for the components of the
power flo~1 in the Kretschmann Prism-Metal Film-Air
configuration have been derived.
Analysis made shovled that splitting of the classical
dispersion equation into two branches (w - mode and w+ mode)
known in li~erature for the case of symmetriC environment
occurs also for the case of asymmetric environment, but
the 0/ mode branch is represented by a number of discrete
points only. It vias also shown that part of the IJj + mode
branch known in 11 terature is physically unreal.
In addition to the two branches mentioned a third
'side' branch have been found, which turned out to be
physically unreal.
The study of physically significant results revealed
back-bending segments in the w- and w+ branches which
demonstrate the phenomena of artificial anomalous dispersion The developed teclli1ique of the numerical solution
of the exact dispersion equation allo~lS to extehd
applicability of the SPLP method to the case of very thin
metal films and puts no restrictions on the type of the
environment
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A Study on the Improvement of Surface Plasmon-Polariton