Statistics for A Study on the Improvement of Surface Plasmon-Polariton (SPLP) Method for the Determination of Compelx Dielectric Permittivity € and Thickness of thin Metal Films.
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A Study on the Improvement of Surface Plasmon-Polariton (SPLP) Method for the Determination of Compelx Dielectric Permittivity € and Thickness of thin Metal Films. | 0 |
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