Spectral Responses of a-Si:H thin Film Colour Sensors and Fourier Transform Spectrometer
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Date
1997-06
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Addis Ababa University
Abstract
In characterising photovoltaic devices, one of the most important
measurements is the spectral response measurement. Several information can
be obtained from the absolute value of the spectral response at a given
wavelength and from the shape of the spectral response curve. To get accurate
information, precise methods of measurement of the spectral response is quite
important. Fourier Transform Spectrometer is believed to be one of such
measurement set up which furnishes us with accurately measured spectral
response curves. The use of Fourier Transform Spectrometer (FTS) for
measurement of spectral response is not a new application. It had been used to
measure spectral response of both crystalline and amorphous silicon solar cells,
even though the Differential Spectral Response (DSR) method is the most
usual one. However, bias-voltage-controlled colour sensors are quite recent
findings, and so far the spectral responses of them were obtained from the
Differential Spectral Response measurement. Here, the use of Fourier
Transform Spectrometer for measurement of spectral response of a-Si:H thin
film colour sensors was studied by measuring the spectral response of selected
colour sensors and some of the problems associated with this application were
identified. Finally suggestions to improve the set up were given
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Keywords
Fourier Transform Spectrometer