Spectral Responses of a-Si:H thin Film Colour Sensors and Fourier Transform Spectrometer

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Date

1997-06

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Addis Ababa University

Abstract

In characterising photovoltaic devices, one of the most important measurements is the spectral response measurement. Several information can be obtained from the absolute value of the spectral response at a given wavelength and from the shape of the spectral response curve. To get accurate information, precise methods of measurement of the spectral response is quite important. Fourier Transform Spectrometer is believed to be one of such measurement set up which furnishes us with accurately measured spectral response curves. The use of Fourier Transform Spectrometer (FTS) for measurement of spectral response is not a new application. It had been used to measure spectral response of both crystalline and amorphous silicon solar cells, even though the Differential Spectral Response (DSR) method is the most usual one. However, bias-voltage-controlled colour sensors are quite recent findings, and so far the spectral responses of them were obtained from the Differential Spectral Response measurement. Here, the use of Fourier Transform Spectrometer for measurement of spectral response of a-Si:H thin film colour sensors was studied by measuring the spectral response of selected colour sensors and some of the problems associated with this application were identified. Finally suggestions to improve the set up were given

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Fourier Transform Spectrometer

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