X-Ray Structure Analysis of Thin Film Solar Cell Materials
| dc.contributor.advisor | Neumann, H.g. (PhD) | |
| dc.contributor.author | Ahmed, Salah | |
| dc.date.accessioned | 2021-12-21T09:05:31Z | |
| dc.date.accessioned | 2023-11-09T11:26:56Z | |
| dc.date.available | 2021-12-21T09:05:31Z | |
| dc.date.available | 2023-11-09T11:26:56Z | |
| dc.date.issued | 1983-06 | |
| dc.description.abstract | X-ray diffractomery is used for studying the crystalline Structure of thin filr cds/cu xs (where x is slightly less than or egual to 2)solar call materials the different films prepared are cas cuxs and sho2. The cds filrs are prepared by; | en_US |
| dc.identifier.uri | http://10.90.10.223:4000/handle/123456789/29372 | |
| dc.language.iso | en | en_US |
| dc.publisher | Addis Ababa,University | en_US |
| dc.subject | X-Ray Structure Analysis | en_US |
| dc.title | X-Ray Structure Analysis of Thin Film Solar Cell Materials | en_US |
| dc.type | Thesis | en_US |