Determination of Optical Constants of a thin Film Using Rotating Analyzer Ellipsometry of Multiple Angle of Incidence
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Date
2006-06
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Addis Ababa University
Abstract
With multiple angle of incidence rotating analyzer ellipsometry, one can measure
complex refractive index and the thickness of a very thin film simultaneously. This
method is applied on conducting thin film polymer (MDMO-PPV/PCBM[1:1]) for
five angles of incidence. In general, it is not possible to invert the Fresnel equations
to obtain the complex index parameters, instead, the optical method has to be developed.
In the model, the optical parameters are varied to minimize some chosen error
function. And those parameters which give a minimum error function are taken to be
the correct optical constants of the sample. Additional data are also gathered from
absorption measurement, and the two independent measurements are compared. The
complex refractive index and thickness of the sample for wavelengths 532 nm, 632.8
nm, 808 nm and 1064 nm are determined
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Keywords
Determination of optical constants of a thin film