Determination of Optical Constants of a Conducting Polymer Using Reflection Rllipsometry technique
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Date
2005-06
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Addis Ababa University
Abstract
The reflection Ellipsometry technique is employed for the determination of optical
constants of a conducting polymers of thin films using a He-Ne laser wavelength of
632.8 nm and tunable diode laser wavelength 808.4 nm, respectively. The same technique
is also applied to determine the thickness of the thin film. In this experiment
two methods are employed to determine the refractive index of the sample. The
rotating analyzer ellipsometry technique and the static photometric technique. The
refractive indices obtained for the polymer sample at the rotating analyzer angle of
incidence 600 using He-Ne laser of wavelength 632.8 nm and tunable diode laser of
wavelength 808.4 nm are 1.73320 ± 0.000013 and 1.73010 ± 0.000015, respectively.
Almost all the results are reproduced using, the second method called static photometric
technique. The average calculated results at the wavelengths of 632.8 nm and
808.4 nm are 1.7577 and 1.5862,respectively.
The results for the thickness measurement obtained using Ellipsometry technique
strongly agrees with the results obtained from the talystep measurement, the thickness
of the sample lies between 30 - 40 nm, where as the calculated results at wavelengths
of 632.8 nm and 808.4 are 37.8 ± 0.00098 nm and 37.5 ± 0.00077 nm, respectively
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Keywords
Using Reflection Rllipsometry technique