Berga, Tadesse2018-07-182023-11-092018-07-182023-11-091997-06http://10.90.10.223:4000/handle/123456789/9240Reflectance(R), Transmittance(T), and Scattering distribution of thin film TCOs and with their p-I (thin & thick) i-layer stacks have been measUred for various wavelengths. The shape of scattering distributions have been determined by using an easy plot software. The functional dependence of normalised intensity on - wavelength (A) and scattering angle (8) have been detennined for Asahi U & Standard TCO. The thickness of individual layers was determined from reflectance & transmittance measmements by using an optical simulation software for layer stacks. The diffused transmittance determined from transmittance measmement and scattering distribution measmements have been comparedenScattering Distribution of LightThesis