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X-Ray Structure Analysis of Thin Film Solar Cell Materials

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dc.contributor.advisor Neumann, H.g. (PhD)
dc.contributor.author Ahmed, Salah
dc.date.accessioned 2021-12-21T09:05:31Z
dc.date.available 2021-12-21T09:05:31Z
dc.date.issued 1983-06
dc.identifier.uri http://etd.aau.edu.et/handle/123456789/29372
dc.description.abstract X-ray diffractomery is used for studying the crystalline Structure of thin filr cds/cu xs (where x is slightly less than or egual to 2)solar call materials the different films prepared are cas cuxs and sho2. The cds filrs are prepared by; en_US
dc.language.iso en en_US
dc.publisher Addis Ababa,University en_US
dc.subject X-Ray Structure Analysis en_US
dc.title X-Ray Structure Analysis of Thin Film Solar Cell Materials en_US
dc.type Thesis en_US


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